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Deposition Monitors & Controllers


The thickness of a deposited film is often a critical component to obtain desired film performance. Quartz crystal monitors are utilized to monitor or control film thickness during deposition. KJLC offers a variety of options, covering everything from simple monitoring of a single film to controlling complex co-deposition. For a more in depth look at what KJLC has to offer please visit our Selection Guide or our Tech Notes Section.


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ISO:9001 The Kurt J. Lesker Company is a Woman Owned and Operated ISO:9001 certified company. Copyright ©1996-2017 Kurt J. Lesker Company® All rights reserved.